Material measurement is a must-do task in the research and development of radio frequency (RF) and microwave frequency applications. Across diverse fields including printed circuit board (PCB) design, microwave circuit design, materials science, biological research, automotive engineering, and metrology laboratories, precise characterization of various materials is essential for understanding their impact on electromagnetic wave propagation. This knowledge enables more predictable design outcomes and facilitates manufacturing process verification for quality control. The shared challenges across these fields have led to a sustained demand for accurate characterization and measurement of dielectric properties. Parameters of a material, such as its dielectric constant and magnetic permeability, are typically measured by using specialized instruments, such as vector network analyzers, impedance analyzers, and inductance, capacitance, and resistance (LCR) meters, with algorithm software and specialized measurement fixtures.